Reduce cost and improve efficiency MEMS dynamic wafer test system

The STI3000 Dynamic Wafer Level Test System uses STI's patented technology (DST) to drive MEMS movements on a wafer with a single drive voltage to measure the resulting various characteristics. It is the most advanced and efficient wafer level in the world. MEMS test system.

The STI3000 test system can greatly improve test efficiency and reduce the development and production costs of new products.

STI3000 MEMS Dynamic Test System

STI3000 MEMS Dynamic Test System

The STI test system consists of basic system modules, including computers, power supplies, test heads, probe cards, software and expansion ports. Test different types of probe cards at the test head according to customer test requirements. If the customer changes the application test, simply replace the test program and the probe card. The entire system has significant advantages such as small size, strong compatibility, fast and stable testing.

Dynamic testing, internal structure of test head, practical application

Dynamic test parameters

* Frequency response * Resonance frequency * Elastic stability rate * Gyro quadrature error

* Mechanical hysteresis * Working potential (eV) * Hermitian * Static damping

* Particle damping * Q value * Dynamic attribute * AC performance

Advantages of dynamic testing

Wafer level dynamic testing can:

– Reduce test time for the entire wafer and device

– Transfer some device test time to wafer test, faster

– Reduce product inconsistency through data analysis

- Increase production

– Reduce device level calibration and testing

– shorten the time from production to market entry

– Whether the simulation test design is perfect

– greatly reduced overall production test costs

Comparison of traditional MEMS test methods and dynamic test methods

A MEMS capacitor accelerometer is manufactured in two production processes. One process uses a traditional wafer testing method, while the other uses a dynamic wafer testing method. The STI3000 Dynamic Wafer Test data increases the pass rate of the final device-level test by 40%.

Comparison of traditional MEMS test methods and dynamic test methods

Save time by 1.8s/device with STI3000 MEMS dynamic wafer test

CSRME Safety Controller is developed for standard GB27607. By monitoring machine tool safety related equipment, the security of machine control system can meet the requirements of GB27607, and its security meets the requirements of ISO13849-1 (PLe) and IEC61508 (SIL3).

With rich interfaces, CSRME has limited programmable function. It can simultaneously replace many different types of safety control modules or safety PLCs, thus greatly simplifying the safety design of machine control systems and reducing cost.

Safety Controller

Safety Controller,Modular Safety Controller,Safety Controller,Electrical Safety Controller,Programmable Logic Controller,Banner Safety Controller

Jining KeLi Photoelectronic Industrial Co.,Ltd , https://www.sdkelien.com